JEOL JSPM-5200 Instructions Manual page 189

５ MEASUREMENT OPERATION
■ Observation of Later
You can perform lateral modulation FFM measurement by additionally installing the
optional Extended Lock-in Amplifier. When the lock-in amplifier is connected to the
SPM controller, you have to set the instrument using the software to display the tab
window for lateral modulation FFM measurement.
Obse rvation of a topography image
You first observe the topography image of the specimen surface, and confirm that you
can obtain a good image. T
Setti ng Lock-in Amplifier
Set the lock-in amplifier as you did in Sect. 5.5.3 when you observe an image in the
lateral modulation FFM measurement tab window.
Observation of an image
1.
Carry out the AFM observation using the Contact mode according to the
usual method.
Confirm that you can observe well the AFM topography image.
2.
When scan is finished, specify parameters according to the settings of the
following SPM Paramete
a.
Select 4 Inputs from Acquisition.
b.
Select LM-FFM from Mode.
c.
Set Display Source to the following.
5-126
al Modulation FFM Image (optional measurement)
hen retract the tip.
rs window.
TMPM5200-2