JEOL JSPM-5200 Instructions Manual page 269

Scanning probe microscope
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5 MEASUREMENT OPERATION
• Si
ngle SPS
You
Specify the kind of SPS measurement to perform and
urement using the SPM Parameters window.
• S
PS Mapping
You can perform SPS M
performed at every pixel in one
measurement to perform and the parameters for the measurement using the SPM
Parameters window. The number of pixels is 128 × 128 in the SPS Mapping scan
mode.
If you specify I-V for SPS measurement, the CITS (Current Imaging Tunneling
Spectroscopy) scan will be performed. The images displayed during scanning are as
follows:
STM/
AFM
S
pecify the scanning mode. Strictly speaking, specify the kind of signal to use for
Z-d
irection feedback in this selection box.
• STM
This is the STM mode. The logarithmic value of the tunneling current is used for
the feedback signal.
Contact
This is the Contact mode in the AFM mode. The Force signal is used for feedback.
• AC
This
frequency-amplitude signal of the cantilever oscillation is used for feedback.
• FM
This is the AC mode in the AFM mode. The frequency signal (FMD signal) of the
cantilever oscillation is used for feedback.
• Phase
This is the AC mode in the AFM mode. The Phase signal of the cantilever oscilla-
tion is used for feedback.
5-206
can perform various kinds of SPS (Scanning Probe Spectroscopy) measu
apping measurement. The specified SPS measurement is
Topo
image
Current
image
"
"
is the AC mode in the AFM mode. The RMS (Root-Mean-Square) of the
frame (Topography) scan. Specify the kind of SPS
Current
"
"
image
"
"
"
"
"
"
"
"
"
rement.
the parameters for the meas-
TMPM5200-2

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