JEOL JSPM-5200 Instructions Manual page 179

５ MEASUREMENT OPERATION
Preca utions in observing F
Since the cantilever torsion is observed statically, unevenness of the specimen surface
affects the friction force image. Therefore, you must also observe the topography image
simultaneously in order to properly evaluate the FFM image.
To reduce the eff
y ou use the optional Lateral Modulation FFM attachme
The contrast of an FFM image is affected by the scanning speed (Clock/ms) and
repul sive force between the specimen surface and the cantilever tip (Reference/V). For a
specim en with less co
the r epulsive force larger.
In additio
function
Other general cautions, grabbing, storing and processing of an image are
Chapter 6, "Analysis Operation".
■ Current im
age observation
An ampl
c ontact current image as well as a topography image using a conductive cantilever.
More over, you can carry out an
Preparati on for Current Image Observation
• Af
fixing a cantilever for JSPM-5200/JSPM-5700
Use a conductive cantilever such as a Si cantilever or a cantilever with bot
coated with gold. Affix the cantilever on a non-contact cantilever holder. Make sure
that good condu
conductive paste such as Conductive paste especially for a gold-coated c
since the conductivity between the front face and the rear face is not so good.
The figure above is for the JSPM-5
——
5-116
FM image
ect of the unevenness of the specimen surface, it is recommended that
ntrast, try changing Reference/V a little to the positive side to make
n, you can adjust the brightness of a grabbed image using the image processing
(Brightness/Contrast).
ifier for current detection is built in the AFM he
ctivity is kept between the cantilever and the cantilever holder. Use
Gold-coated
surface
Side of
glass base
CAUTION ———————
When applying conductive paste to the cantilever and the cantile-
ver holder, be su re not to apply the conductive paste to the canti-
lever piezoelectric element. When replacing
confirm that no previously used conductive paste remains on the
holder. Otherwise, the cantilever will tilt, ca
beam not to irradiate the right position.
I-V measurement at a specified point of the specimen.
Base
Conductive paste
Piezoelectric
element for
vibration
200.
nt.
ad unit. You can acquire a
a cantilever, be sure to
using the reflected laser
the
detailed in
h sides
antilever
TMPM5200-2