JEOL JSPM-5200 Instructions Manual page 200

■ I-V measurement
The following is the procedure for measuring the I-V characteristic of the specimen
surface.
1.
Observe a current image and grab it.
2.
Select the I-V Curve radio button at the left bottom of the STM tab window.
3.
Click on the I-V button.
The I-V Parameters window opens.
4.
Click on the Retract On button in the STM tab window.
5.
Click on the Position button on the I-V Parameters window.
The I-V Parameters window will close and the Tip position window will open.
Move the mouse cursor to the current image in the Display Window; then the cursor
will change to a hand mark. The present position of the cantilever is displayed with
a "+" mark. Usually, the initial position of the cantilever is the top left corner as
shown below.
TMPM5200-2
Before setting the position for I-V measurement, retract the tip. This is for
preventing the tip from contacting the specimen surface and deforming, when
you move the tip to the position to measure.
Tip position
Mouse cursor
５ MEASUREMENT OPERATION
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