JEOL JSPM-5200 Instructions Manual page 92

Scanning probe microscope
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Topography and phase images
• Topographic image observation
AFM topographic images are obtained with
vicinity of its characteristic frequency and with the amplitude of vibration of the
cantilever remaining constant during scanning.
1.
C
lick on the
2.
C
lick on the
3.
C
lick on the Source Gain TOPO
• Phase image observation
Phase images can be obtained by imaging phase variation in the vicinity of the
cantilever characteristic frequency.
1.
Click on the
t
he pull-down menu.
2.
C
lick on the
Simultaneous observation of topographical and phase images
Both images can be observed at a time as follows:
1.
Click on the
2.
Click on the
the pull-down menu.
3.
Click on the Source Gain TOPO
Now you have completed the parameter settings for observing a topographical
image in the A
4.
Click on the Scan button to start observation. The topogr phical image and
phase image appear.
TMPM5200-2
button in the Source 1 selection box and select Topography.
button in the Source 2 selection box and select None.
button in the Source 1 selection box and select Phase from
button in the Source 2 selection box and select None.
The setting of Source Gain is available only for Topography.
button in the Source 1 selection box and select Topography.
button in the Source 2 selection box and select Phase from
C mode.
the cantilever being vibrated in the
button and select 1.
button and select 1.
Topography
Phase
image
image
5 MEASUREMENT OPERATION
a
5-29

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