JEOL JSPM-5200 Instructions Manual page 308

Scanning probe microscope
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KFM
You can perform SKPM measurement when the optional Extended Lock-in Amplifier is
installed in the instrument for lateral modulation FFM. Explained here is the setting for
SKPM measureme
The foll
selection box in the Scan frame of the SPM Parameters window.
• KFM Feedback on
When you check this check box, the KFM feedback of the bias voltage will start.
Then the CPD signal is output from the AFM AMP unit, an
SKPM measurement.
• CPD Polar
When you check this box, the polarity of the CPD signal output from the AFM
AMP unit will be reversed. Change this according to whether the bias voltage
applies to the tip or to the specimen.
• Lock-in-AMP signal
Select the desired reference signal for the Lock-in Amplifier that is necessary for
KFM feedback.
A–B/A+B: Output the A–B/A+B signal to the Lock-in Amplifier.
FMD:
Filter/KHz: Sets the feedback filter
Gain:
Offset:
TMPM5200-2
nt.
owing KFM dialog box will be in effect if you select KFM in the Mode
ity Reverse
Outputs the F
MD
Amplifier.
Sets the gain (loop gain) to KFM feedback.
Sets the DC offset voltage to be applied to the tip.
5 MEASUREMENT OPERATION
sig
nal
(frequency-detection signal) to the Lock-in
to KFM feedback.
d you can perform
5-245

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