JEOL JSPM-5200 Instructions Manual page 293

５ MEASUREMENT OPERATION
High Bias
This is the same function as High Bias on the Bias tab window in the Advanced Control
window.
Position
This specifies the initial position to perform the SPS measurement.
For detailed operations, refer to the measuring procedure in the SPM mode
(I-V,S-V,I-S,FC,FFC).
Approach Conditions
Specify approach conditions in this frame. When the Approach On button is clicked on,
approach is performed according to the conditions specified in this frame.
• Advanced button
There are two ways to conduct the approach operation. One is approach by software
control, and the other is approach by hardware operation. Clicking on the Advanced
button displays the Tip Advanced window, in which you can specify detailed
settings.
• Approach by software control
5-230
STM mode
Current/nA
Feedback Filter/Hz
Sample Bias/V
The JSPM − 5200 and JSPM − 5700 perform approach by software control.
Enter the Z scanner voltage (usually 0 V) in the Z Stop Position/V input box in
the Tip Advanced window.
In approach by software control, once the approach conditions that are speci -
fied in the Tip Advanced window are complete, the Approach dialog box will
change to the following state:
Approach and processing have automatically stopped.
This state shows that approach by software control has automatically stopped,
and that the Z-scanner position is in the value specified in the Z Stop Posi-
AFM mode
Reference/V
Feedback Filter/Hz
TMPM5200-2