Freescale Semiconductor e200z3 Reference Manual page 61

Note that Book E instructions that access CR bits, such as Branch Conditional (bc), CR logicals, and Move
to Condition Register Field (mtcrf), determine the bit position by adding 32 to the value of the operand.
For example, the BI operand accesses the bit BI + 32, as shown in
CR n CR
BI
Bits Bits
CR0[0] 32 00000 Negative (LT)—Set when the result is negative.
For SPE compare and test instructions:
Set if the high-order element of rA is equal to the high-order element of rB; cleared otherwise.
CR0[1] 33 00001 Positive (GT)—Set when the result is positive (and not zero).
For SPE compare and test instructions:
Set if the low-order element of rA is equal to the low-order element of rB; cleared otherwise.
CR0[2] 34 00010 Zero (EQ)—Set when the result is zero. For SPE compare and test instructions:
Set to the OR of the result of the compare of the high and low elements.
CR0[3] 35 00011 Summary overflow (SO). Copy of XER[SO] at the instruction's completion.
For SPE compare and test instructions:
Set to the AND of the result of the compare of the high and low elements.
CR1[0] 36 00100 Negative (LT)—For SPE and SPFP compare and test instructions:
Set if the high-order element of rA is equal to the high-order element of rB; cleared otherwise.
CR1[1] 37 00101 Positive (GT)—For SPE and SPFP compare and test instructions:
Set if the low-order element of rA is equal to the low-order element of rB; cleared otherwise.
CR1[2] 38 00110 Zero (EQ)—For SPE and SPFP compare and test instructions:
Set to the OR of the result of the compare of the high and low elements.
CR1[3] 39 00111 Summary overflow (SO)—For SPE and SPFP compare and test instructions:
Set to the AND of the result of the compare of the high and low elements.
CR n [0] 40 01000 Less than (LT)
44 01100 For integer compare instructions:
48 10000 rA < SIMM or rB (signed comparison) or rA < UIMM or rB (unsigned comparison).
52 10100 For SPE and SPFP compare and test instructions:
56 11000 Set if the high-order element of rA is equal to the high-order element of rB; cleared otherwise.
60 11100
CR n [1] 41 01001 Greater than (GT)
45 01101 For integer compare instructions:
49 10001 rA > SIMM or rB (signed comparison) or rA > UIMM or rB (unsigned comparison).
53 10101 For SPE and SPFP compare and test instructions:
57 11001 Set if the low-order element of rA is equal to the low-order element of rB; cleared otherwise.
61 11101
CR n [2] 42 01010 Equal (EQ)
46 01110 For integer compare instructions: rA = SIMM, UIMM, or rB.
50 10010 For SPE and SPFP compare and test instructions:
54 10110 Set to the OR of the result of the compare of the high and low elements.
58 11010
62 11110
CR n [3] 43 01011 Summary overflow (SO).
47 01111 For integer compare instructions, this is a copy of XER[SO] at the completion of the instruction.
51 10011 For SPE and SPFP vector compare and test instructions:
55 10111 Set to the AND of the result of the compare of the high and low elements.
59 11011
63 11111
Freescale Semiconductor
Table 2-6. BI Operand Settings for CR Fields
e200z3 Power Architecture Core Reference Manual, Rev. 2
Table 2-6.
Description
Register Model
2-13