HBM Genesis GEN5i User Manual page 445

Portable, integrated data acquisition system
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Analog Input Section
Channels
Connectors
Input type
Input coupling
Impedance
Ranges
Offset
DC Offset error
DC Gain error
Maximum static error (MSE)
RMS Noise
Common Mode
Rejection Ratio (CMRR)
Input overload protection
Overload recovery time
Isolation
Channel-to-chassis
Channel-to-channel
Nondestructive, to chassis (earth)
Analog to Digital Conversion
Sample rate; per channel
ADC resolution; one ADC per channel
ADC Type
Time base accuracy
Binary sample rate
Maximum binary sample rate
External time base sample rate
External time base level
External time base minimum pulse width
Mainframes using Interface/Controller modules shipped before 2012: ± 30 ppm
(1)
I2679-4.0 en
8
Fully isolated BNC (Plastic), 1 per channel
Analog isolated single ended, unbalanced differential
DC, GND
1 MΩ ± 1% // 55 pF ± 10%
± 2.0 V, ± 4.0 V, ± 10.0 V, ± 20 V, ± 40 V, ± 100 V
Each fixed range supports a variable gain with 1000 steps (0.1 %).
Variable gain creates 1000 extra ranges between 2 fixed ranges.
± 50 % in 1000 steps (0.1 %);
± 100 V range has fixed 0 % offset
0.1 % of Full Scale ± 2 mV
Wideband
0.1 % of Full Scale ± 10 μV
Bessel IIR and FIR
± 100 ppm/°C (± 180 ppm/°F)
Offset error drift
0.1 % of Full Scale ± 2 mV
Wideband
0.1 % of Full Scale ± 10 µV
Bessel IIR and FIR
± 70 ppm/°C (± 130 ppm/°F)
Gain error drift
0.1 % of Full Scale ± 2 mV
Wideband
0.1 % of Full Scale ± 10 µV
Bessel IIR and FIR
0.02 % of Full Scale ± 10 μV
Wideband
0.02 % of Full Scale ± 10 μV
Bessel IIR and FIR
> 72 dB @ 80 Hz
Voltage
250 V DC
± 250 V DC
Maximum voltage
Restored to 0.1 % accuracy in less than 1 μs after 200 % overload
± 250 V DC
± 500 V DC
± 250 V DC
0.1 S/s to 100 MS/s
14 bit
CMOS pipelined multistep converter, LTC2254
Defined by mainframe: ± 3.5 ppm
Not supported
N/A
0 S/s to 10 MS/s
TTL
50 ns
; aging after 10 years ± 10 ppm
(1)
GEN5i
445

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