Agilent Technologies ENA Series User Manual page 550

Specifications and Supplemental Information
Test Port Input
Table 16-11 Test Port Input (Trace Noise)
Description
*1
Trace Noise Magnitude
300 kHz to 3 MHz
(source power level = +10 dBm)
3 MHz to 3 GHz
(source power level = +10 dBm)
3 GHz to 4.25 GHz
(source power level = +9 dBm)
4.25 GHz to 6 GHz
(source power level = +7 dBm)
6 GHz to 7.5 GHz
(source power level = +5 dBm)
7.5 GHz to 8.5 GHz
(source power level = +5 dBm)
*1
Trace Noise Phase
300 kHz to 3 MHz
(source power level = +10 dBm)
3 MHz to 3 GHz
(source power level = +10 dBm)
3 GHz to 4.25 GHz
(source power level = +9 dBm)
4.25 GHz to 6 GHz
(source power level = +7 dBm)
6 GHz to 7.5 GHz
(source power level = +5 dBm)
7.5 GHz to 8.5 GHz
(source power level = +5 dBm)
*1.Trace noise is defined as a ratio measurement of a through, at IFBW = 3 kHz.
544
Specification
1 mdB rms (23°C±5°C)
1.2 mdB rms (23°C±5°C)
3.6 mdB rms (23°C±5°C)
3.6 mdB rms (23°C±5°C)
6 mdB rms (23°C±5°C)
Supplemental Information
5 mdB rms (typical)
8 mdB rms (high temperature
mode: ON, typical)
4 mdB rms (high temperature
mode: ON, typical)
4.8 mdB rms (high temperature
mode: ON, typical)
7.2 mdB rms (high temperature
mode: ON, typical)
7.2 mdB rms (high temperature
mode: ON, typical)
9.6 mdB rms (high temperature
mode: ON, typical)
0.035 ° rms (23°C±5°C, typical)
0.05 ° rms (high temperature
mode: ON, typical)
0.007 ° rms (23°C±5°C, typical)
0.02 ° rms (high temperature
mode: ON, typical)
0.008 ° rms (23°C±5°C, typical)
0.024 ° rms (high temperature
mode: ON, typical)
0.025 ° rms (23°C±5°C, typical)
0.042 ° rms (high temperature
mode: ON, typical)
0.025 ° rms (23°C±5°C, typical)
0.042 ° rms (high temperature
mode: ON, typical)
0.042 ° rms (23°C±5°C, typical)
0.06 ° rms (high temperature
mode: ON, typical)
Chapter 16