Improving Measurement Throughput; Using Fast Sweep Modes - Agilent Technologies ENA Series User Manual

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Optimizing Measurements

Improving Measurement Throughput

Improving Measurement Throughput
This section explains the following three methods to improve the measurement throughput.

Using Fast Sweep Modes

The E5070B/E5071B provides four sweep modes: "Stepped mode" and "swept mode," and
their accelerated versions "fast stepped mode" and "fast swept mode." You can shorten
sweep time as shown in Table 12-1 by using the swept mode or its fast modes.
NOTE
If it is not necessary to shorten the sweep time, use the stepped mode (preset
configuration).
Table 12-1
Sweep time criteria (each measurement point interval)
2 MHz to 5 MHz
5 MHz to 8 MHz
8 MHz to 10 MHz
10 MHz to 30 MHz
30 MHz to 50 MHz
50 MHz to 70 MHz
Table 12-2
Characteristics of sweep mode
Measurement
Sweep time
Restrictions
measurement
410
"Using Fast Sweep Modes" on page 410
"Turning off the updating of information displayed on the LCD screen" on page 414
"Turning off system error correction" on page 414
Measurement
Shorter (faster sweep)
point interval
Swept
2 MHz or less
Fast swept
Fast swept
Fast swept
Fast swept
Fast swept
Fast swept
Fast stepped
Fast stepped
70 MHz or more
Fast stepped
Stepped
High
reliability
Long
(Except when the
measurement point
interval is
approximately 10
MHz or more)
No particular
on
restriction
Fast stepped
Swept
Swept
Fast stepped
Fast stepped
Fast stepped
Stepped
Fast swept
Stepped
Stepped
Swept
Fast stepped
Relatively low
Relatively low
Short
Short
(Only when the
(Shortest when the
measurement point
measurement point
interval is
interval is
approximately 10
approximately 30
MHz or less)
MHz or more)
DUTs with long
No particular
electrical delay
restriction
cannot be measured
correctly
Longer (slower sweep)
Stepped
Fast stepped
Stepped
Stepped
Stepped
Swept
Stepped
Swept
Swept
Swept
Fast swept
Swept
Fast swept
Low
Short
(Shortest when the
measurement point
interval is
approximately 30
MHz or less)
DUTs with long
electrical delay
cannot be measured
correctly
Chapter 12

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