Reference Sensitivity - Etsi Gsm 11.10 Section 14.2; I/Q Tuning Measurement; Dynamic Power Measurement - Agilent Technologies 8960 10 Series Reference Manual

Test Adherence to Standards
Making a faster ORFS measurement.
When Multi-Measurement Count (Modulation) is greater than 1, the measurement is performed over 40 or
more bits in each of the regions from bit 15 to 60 and bit 87 to 132 of the burst. In GSM 11.10, the
measurement is only specified on the latter section of the burst.
Measuring on both the front and back of the burst has two advantages. First, this method provides two
modulation measurements per burst to the user, effectively doubling measurement throughput. Secondly, it
provides additional information regarding the spurious performance of the mobile.
The method of test in GSM 11.10 is based upon time gated spectrum analysis; this technique only allows one
measurement per bust. Modern DSP techniques employed in the test set makes it possible to measure more of
the burst while still excluding the unwanted effects of the midamble and switching transients generated by
burst modulation.
Measurements
"Output RF Spectrum Measurement Description" on page 75

Reference Sensitivity - ETSI GSM 11.10 section 14.2

The method of test implemented by the test set's Bit Error measurement conforms to the measurement
method defined in "ETSI GSM 11.10 Ver 4.21.1 Sect 14.2.".
Making a faster Reference Sensitivity measurement.
An alternative method of test for making a Reference Sensitivity measurement is to use the Fast Bit Error
(FBER) measurement in the test set. The FBER measurement is five times faster than the normal BER
measurement.
Measurements
"Bit Error Measurement Description" on page 48
"Fast Bit Error Measurement Description" on page 69

I/Q Tuning Measurement

The I/Q Tuning measurement is not an ETSI specified measurement.
Measurements
"I/Q Tuning Measurement Description" on page 63

Dynamic Power Measurement

The Dynamic Power measurement is not an ETSI specified measurement.
Measurements
"Dynamic Power Measurement Description" on page 61
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