Agilent Technologies 8960 10 Series Reference Manual page 342

Wireless communications test set, gsm mobile test application
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FETCh:PVTime
FETCh:PVTime:MASK[:FAIL]?
Function
Queries power versus time measurement mask pass/fail indicator.
Query
Range: 0 (pass) or 1 (fail) and 9.91 E+37 (NAN)
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FETCh:PVTime:MASK:UPPer[:MARGin]?
Function
Queries the power versus time measurement upper limit margin worst case result.
The upper limit margin, worst case result is the power versus time measurement with the least
difference between measured power and the power level boundary specified by the power versus
time mask. See the
Range: −100 dB to 0 dB and 9.91 E+37 (NAN)
Query
Resolution: 0.01 dB
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FETCh:PVTime:MASK:UPPer:TIME?
Function
Queries the power versus time measurement's upper limit margin time, worst case result.
The upper limit margin time result is the point in time, relative to bit 0 in the GSM burst, that
corresponds with the worst case measurement result (the measurement with the least difference
between measured power and the upper power level boundary specified by the power versus time
mask). See the
Range: −50 µs to 593 µs and 9.91 E+37 (NAN)
Query
Resolution: 1 ns
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FETCh:PVTime:MASK:LOWer[:MARGin]?
Function
Queries the power versus time measurement's lower limit margin, worst case result.
The lower limit margin, worst case result is the power versus time measurement with the least
difference between measured power and the lower power level boundary specified by the power
versus time mask. See the
Range: −100 dB to 0 dB and 9.91 E+37 (NAN)
Query
Resolution: 0.01 dB
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342
S:\Hp8960\E1960A GSM Mobile Test Application\A.04 Release\Reference_Manual\Chapters\hpib_fetch_pvtime.fm
"Typical GSM PvT Measurement" on page
"Typical GSM PvT Measurement" on page
"Typical GSM PvT Measurement" on page
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