Debug Event Generation - Infineon Technologies TC1728 User Manual

32-bit single-chip microcontroller
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Core Break -In
Execution of the
DEBUG Instruction
Execution of MTCR /
MFCR Instruction
Figure 16-3 Basic TriCore Debug Concept

16.2.1.2 Debug Event Generation

If debug mode is enabled, debug events can be generated by:
Debug event generation from debug triggers
Activation of the external Core Break-In signal to the core
Execution of a DEBUG instruction
Execution of an MTCR/MFCR instruction
Debug Event Generation from Debug Triggers
The debug event generation unit is responsible for generating debug events when a
programmable set of debug triggers is active. Debug triggers can be generated by the
code and data protection logic.
These debug triggers provide the inputs to a programmable block of combinational logic
that outputs debug events. The aim is to be able to specify the breakpoints that use fairly
simple criteria purely in the on-chip debug event generation unit, and to rely on help from
the external debug system or debug monitor to implement more complex breakpoints.
User's Manual
OCDS, V1.5
Debug
Event
Generation
On-Chip Debug Support (OCDS)
16-7
TC1728
Debug
Event
Processing
TriCore_OCDS.vsd
V1.0, 2011-12

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