Keithley 4200-SCS Reference Manual page 1246

Semiconductor characterization system
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Section 16: Models 4220-PGU, 4225-PMU, and 4225-RPM
Figure 16-57
Scroll (or move) a magnified entire test graph
Errors
If either graph is not updating as expected, press the refresh button to zoom out and redraw both
graphs. It is possible to have a test with too many pulses to be suitably graphed. This may be from
too many pulses from a large number of sweep points or step points, or a large value for the
number of pulses.
Note that this lack of display does not mean that the test will not run. If pressing OK at the PMU
Timing dialog does not generate any warning or error messages, then the test is valid and runs
(even though the entire test waveform cannot be displayed).
Figure 16-58
Preview error "Too many pulses to graph"
PMU connection compensation
Errors caused by connections and cable length between the Model 4225-PMU and the device
under test (DUT) can be corrected by using connection compensation. When connection
compensation is enabled, each DUT measurement factors in either the default or measured
(custom) compensation values.
16-54
Gap
Cursor
Figure 16-58
shows the output "Too many pulses to graph." for the lower graph.
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Model 4200-SCS Reference Manual
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4200-901-01 Rev. S / May 2017

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