Keithley 4200-SCS Reference Manual page 1592

Semiconductor characterization system
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Appendix K: Cascade Summit-12000 Prober
5.
Enter the label and wafer diameter in the Wafer Map Wizard window
Figure K-19
Step 1: Wafer Map Wizard
6.
Click Next.
7.
Select Flat or Notch based on the actual wafer.
8.
Enter either the primary flat length or the notch diameter in millimeters.
9.
Select the orientation of the flat or notch as applicable
NOTE:
Figure K-20
Step 2: Wafer Map Wizard
10.
Click Next.
11.
Enter the correct die and street sizes
K-12
Bottom is toward front of prober.
Return to
(Figure
K-21).
Section Topics
Model 4200-SCS Reference Manual
(Figure
K-19).
(Figure
K-20).
4200-901-01 Rev. S / May 2017

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