Keithley 4200-SCS Reference Manual page 1683

Model 4200-SCS Reference Manual
Running test sequences
NOTE
The ivswitch project uses the same Interactive Test Modules (ITMs) that are used in the default
project. The primary difference between the two projects is that the ivswitch project uses connect
UTMs to control the switch matrix. As shown in
beginning of each device test sequence.
A test sequence for a device is executed by selecting the Device Plan, and then clicking the green
Run button. When a Device Plan is started, the connect test closes the appropriate matrix
crosspoints to connect the instruments to the appropriate device.
All devices may be tested by selecting the Subsite Plan and clicking the green Run button.
Figure O-8
devices.
Figure O-8
Signal paths for "4terminal-n-fet" tests
N-Channel
SMU1
SMU2
SMU3
GNDU
Figure O-9
Signal paths for "3terminal-npn-bjt" tests
SMU1
SMU2
SMU3
GNDU
4200-901-01 Rev. S / May 2017
For detailed information regarding test and sequence execution, refer to the
execution of individual tests and test sequences
through Figure O-12
MOSFET
Drain
Gate Substrate
Source
1 2 3 4 5
NPN
Transistor
Base
1 2 3 4 5
Return to
Figure
show the signal paths that are automatically selected for the five
6 7 8 9 10 11 12
Collector
Emitter
6 7 8 9 10 11 12
Section Topics
Appendix O: Advanced Applications
in Section 6 of the Reference Manual.
O-7, there is a connect UTM at the
A
B
C
D
A
B
C
D
Run
O-7