Keithley 4200-SCS Reference Manual page 1549

Model 4200-SCS Reference Manual
NOTE:
2.
3.
Step 3. Creating a site definition and defining a probe list
NOTE:
Creating a site definition for a single subsite per die involves using the software to create a
selection of dies to probe. If a single subsite per die is to be probed, refer to
project example
involves using the software to create a selection of dies to probe, but also includes creating a
selection of the subsites on each die that will be probed. If multiple subsites per die will be probed,
refer to
Use the following information to load a previously-defined and saved site definition.
Single subsite per die
1.
2.
3.
Figure I-12
pcWfr button
Figure I-13
Die Program Tools window
4200-901-01 Rev. S / May 2017
Since the platen moves to make or break contact between the pins and pad,
clicking Auto Raise will automatically separate the pins from the pads while Auto
Lower will allow automatic contact.
Check Auto Raise on the pcNav Tools window.
Check Anti-backlash on the pcNav Prb8860 window.
The following setup procedure is accomplished using the pcBridge computer.
later in this appendix. Creating a site definition for multiple subsites per die also
probesubsites KITE project example
Start pcWafer by clicking the pcWfr button
The pcWfr window will appear.
Click the Open button on the Die Program Tools window
file or New to create a new file.
Select the desired file and click OK.
Return to
later in this appendix.
(Figure
Save
New
Section Topics
Appendix I: Micromanipulator 8860 Prober
probesites KITE
I-12) located in the pcLaunch window.
(Figure I-13) to open an existing
Open
I-9