Keithley 4200-SCS Reference Manual page 1609

Semiconductor characterization system
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Model 4200-SCS Reference Manual
8.
Figure K-55
Make four new subsites
9.
10.
11.
Figure K-56
Relabel the subsites
4200-901-01 Rev. S / May 2017
Continue to add new subsites as desired until finished
Click on the label name and type in a new description to relabel each subsite
To mark the subsite for testing, check the box at the front of each label. To skip testing the
subsite, uncheck the box at the front of each label.
Click File
Save on the Wafer Map dialog
Return to
(Figure
Section Topics
Appendix K: Cascade Summit-12000 Prober
(Figure
K-55).
K-51) to save the wafer map.
(Figure
K-56).
K-29

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