Keithley 4200-SCS Reference Manual page 1686

Semiconductor characterization system
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Appendix O: Advanced Applications
Figure O-14
"connect" parameters for "4terminal-n-fet" device
Sequencing tests on multiple devices
For the previous tutorial, a switch matrix was added to the test system to automate connection
changes for different devices. When a test sequence for a device (Device Plan) is executed, the
connect test closes the appropriate matrix crosspoints to connect that device to the appropriate
instrumentation. The test sequence stops after the Device Plan has been executed.
This tutorial demonstrates how to run a test sequence that will automatically test all the devices in
the ivswitch project. After all the devices have been tested, the test sequence will stop.
Open "ivswitch" project
If the ivswitch project is not currently open, open it using the Open Project item of the File menu
on the toolbar. The Project Navigator for the ivswitch project is shown in
With a switch matrix added to the system, all the devices can be tested by starting the test
sequence from the subsite level of the Project Navigator.
selected (highlighted) to execute.
Figure O-15
Project Navigator - "ivswitch" project
O-10
Opens all relays
Connects SMU1 to pin 3 of test fixture
Connects SMU2 to pin 4 of test fixture
Connects SMU3 to pin 5 of test fixture
Connects GNDU to pin 6 of test fixture
Subsite Plan
Return to
Section Topics
Model 4200-SCS Reference Manual
Figure
O-15.
Figure O-15
shows the Subsite Plan
4200-901-01 Rev. S / May 2017

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