Keithley 4200-SCS Reference Manual page 1627

Semiconductor characterization system
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Model 4200-SCS Reference Manual
2.
Figure L-25
CM500 Prober Edit Program Site window
3.
Figure L-26
CM500 Prober wafermap includes program sites
4.
Figure L-27
CM500 Prober Run Program Sites icon
4200-901-01 Rev. S / May 2017
Select the Enter Site Map function.
Move the mouse onto the WAFERMAP window and then either:
Select the dies to be tested on wafermap and Press the Enter button.
OR
Press the Enter All button to test all dies.
To step through all the programmed sites, select the Run Program Site icon on toolbar.
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Section Topics
Appendix L: Signatone CM500 Prober
L-13

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