Keithley 4200-SCS Reference Manual page 1562

Semiconductor characterization system
Hide thumbs Also See for 4200-SCS:
Table of Contents

Advertisement

Appendix I: Micromanipulator 8860 Prober
Figure I-42
Edit Die Program Parameters window
Figure I-43
Spline Pattern window
14.
Click the Save button on the Die Program Tools window
15.
To open an existing program listing file, click the pcWfr Open button on the Die Program
Tools window. Select the desired file, and click OK.
NOTE:
KCON
NOTE:
Use KCON to add the prober to the configuration:
1.
From the Tools menu (on the Keithley CONfiguration Utility window), click Add External
Instrument Probe Station
I-22
Before starting testing, physically align the pins over the reference die.
The following configuration is accomplished using the Model 4200-SCS computer.
Return to
(Figure
I-44). The probe station Properties tab appears.
Section Topics
Model 4200-SCS Reference Manual
Spline Pattern
(Figure
I-41).
4200-901-01 Rev. S / May 2017

Advertisement

Table of Contents
loading

Table of Contents