Keithley 4200-SCS Reference Manual page 1687

Semiconductor characterization system
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Model 4200-SCS Reference Manual
Modify test sequence
The Project Navigator shows the execution sequence for the Subsite Plan. As shown in
Figure
You can change the device test sequence using the Subsite Plan Sequence tab. This exercise
shows how to change the test sequence by making diode the first device in the sequence:
1.
2.
3.
4.
Figure O-16
Subsite Plan window
Figure O-17
"diode" moved to top of sequence table
4200-901-01 Rev. S / May 2017
O-15, the 4terminal-n-fet will be tested first, followed by tests for the other four devices.
In the Project Navigator, double-click "subsite" to open the Subsite Plan window (see
Figure
O-16).
In the Device Sequence Table, click diode" to select it.
Use the Move Up button to move diode to the top of the sequence table
At the bottom right-hand corner of the Subsite Plan window, click the Apply button to
change the sequence (see
Return to
Figure
O-18).
Section Topics
Appendix O: Advanced Applications
Figure O-16
shows diode selected.
(Figure
O-17).
O-11

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