Keithley 4200-SCS Reference Manual page 1535

Model 4200-SCS Reference Manual
2.
Figure H-40
ProberBench NT window
3.
Figure H-41
Mark Dies pull-down
4.
NOTE:
4200-901-01 Rev. S / May 2017
From the ProberBench NT window, select WaferMap file
From the WaferMap window, select Mark to Skip from the Mark Dies pull-down
(Figure H-41).
Use Mark to Skip and Mark to Probe to set dies as desired. Clicking on a die in the
WaferMap window either sets or clears the die (see NOTE). The dies color indicates status
(either probe or skip).
With Mark to Probe selected, click and drag to select multiple dies. With Mark to Skip
selected, click and drag to clear multiple dies. When done, deselect Mark to Skip or
Mark to Probe. Otherwise the Chuck menu will remain grayed.
Return to Section Topics
Appendix H: Suss MicroTec PA-200 Prober
(Figure H-40).
H-27