Keithley 4200-SCS Reference Manual page 1531

Semiconductor characterization system
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Model 4200-SCS Reference Manual
3.
Figure H-32
Mark Dies pull-down
NOTE:
4.
Figure H-33
pa200 WaferMap: save
4200-901-01 Rev. S / May 2017
Use Mark to Skip and Mark to Probe to set dies as desired
in the WaferMap window either sets or clears the die (see note). The die's color indicates
status (probes white dies, skips blue dies).
With Mark to Probe selected, click and drag to select multiple dies. With Mark to Skip
selected, click and drag to clear multiple dies. When done, de-select Mark to Skip or
Mark to Probe. Otherwise the Chuck menu will remain grayed.
Save the WaferMap configuration
Return to
(Figure
H-33).
Section Topics
Appendix H: Suss MicroTec PA-200 Prober
(Figure
H-32). Clicking on a die
H-23

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