Keithley 4200-SCS Reference Manual page 1573

Semiconductor characterization system
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Figure J-3
Prober Action Required dialog: Move probes to next site
8.
NOTE:
Figure J-4
Prober Action Required dialog: Move probes to next subsite
Fake prober overview
Use the FAKE prober to test without probing (the prober will not probe). This can be useful to take
the prober offline (disable) when you want to run the test without modifying your project.
Configuring the environment for a FAKE prober stops all prober actions.
The FAKE prober is useful when prober actions are not desired (for example, when debugging
projects). When using the FAKE prober, tests can be executed in a single or looping fashion. This
allows debugging of projects without having to remove prober calls. Situations when the FAKE
prober mode may be useful:
1.
2.
4200-901-01 Rev. S / May 2017
Steps 5 through 7 are repeated until all sites are tested.
Subsite probing uses the PrssMovNxt command in step 6 to move to the next
subsite
(Figure
J-4).
Looping on the same wafer location using a project that supports wafer prober operations
(for instance, testing one site 100 times instead of testing 100 different sites once).
Disabling prober function calls until the testing portions of the project are functioning
correctly.
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Section Topics
Appendix J: Using a Manual or Fake Prober
J-3

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