Keithley 4200-SCS Reference Manual page 1561

Semiconductor characterization system
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Model 4200-SCS Reference Manual
Figure I-40
Set Reference dialog box
12.
NOTE:
13.
Figure I-41
Die Program Tools window
4200-901-01 Rev. S / May 2017
Select the dies to test using the mouse (site turns green to test).
The order of selection of the die, the spline pattern (change using edit die program),
and the reference die location determine test order sequence.
Set spline pattern (optional).
• Click the Edit Die Program Parameters button located on the Die Program Tools
window of pcWfr. The Edit Die Program Parameters dialog box will open
• Click the Spline Pattern button on the Edit Die Program Parameters dialog box. The
Spline Pattern window will open
• Select desired spline pattern (the icon of the active spline pattern is transferred to the
Edit Die Program Parameters dialog box).
Return to
(Figure
I-43).
Edit Die Program Parameters
Save
Section Topics
Appendix I: Micromanipulator 8860 Prober
Open
(Figure
I-41).
I-21

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