Appendix M: WLR Testing
Figure M-1
HCI_1_DUT project plan
Figure M-2
Device Stress Properties window: HCI_1_DUT project
Figure M-3
HCI and NBTI tests: 20 parallel-connected devices stressed by voltage
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M-4
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Model 4200-SCS Reference Manual
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4200-901-01 Rev. S / May 2017