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Section 12: Pulse Projects for Models 4200-PIV-A and 4200-PIV-Q
PulseIV-Complete and Demo-PulseIV projects
The PulseIV-Complete and Demo-PulseIV projects provide PIV (pulse IV) testing. These projects
are included with the Model 4200-PIV-A and 4200-PIV-HR packages.
NOTE
Overall 4200 Pulse IV capabilities
•
Pulse voltage on gate from -5 to +5 V, zero referenced
•
Pulse widths of 40-150 ns (due to RBT), adjustable in 10 ns increments
•
Periods of 40 us and larger (due to RBT), adjustable in 10 ns increments. The maximum
Port Power Divider
•
Pulse transition is programmed to 10 ns, which results in a 13 ns transition time.
•
DC voltage bias on drain, provided by SMU, from -210 V to +210 V.
•
Drain current pulse measurement, up to 100 mA with 5 uA resolution (better resolution
available by averaging multiple pulses) provided by 8 bit scope card.
•
Vds-Id and Vgs-Id sweeps
•
Single pulse scope shot for setup validation and transient testing
Note that the above list is specific to the operation of the entire PIV package. The individual
components, such as the pulse generator card and scope card, may have different capabilities.
For example, the Model 4205-PG2 pulse generator card can be programmed to output a 10 ns
wide pulse, but this pulse is not sufficient for a Pulse-IV measurement and is therefore not
permitted in the supplied PIV setup.
4200 Project: PulseIV-Complete
This project includes all pulse source and pulse measure tests for the 4200-PIV package. This
project is used for both testing on customer devices and demonstration of the 4200-PIV package.
The PulseIV-Complete project has a two Initialization steps for pulse calibration and nine main
tests under the device 4terminal-n-fet. This project permits comparison between DC and pulse IV
sweeps. These nine primary tests consist of three sets. The first test in each set is the DC IV
sweep, with the second test using pulse IV for the sweep. The third test provides both DC and
Pulse IV sweeps combined into a single UTM. The first set is Vds-id, the second is Vgs-id and the
third is another Vds-id test, but with voltages for both the gate and drain increased to demonstrate
self-heating on a device. The last test, scope-shot, provides a snapshot of the pulse waveforms
that are used during the Pulse IV tests. Please note that the values seen in the scopeshot test are
approximate values, although calibrated measurements are also available.
This project supports both nMOS and pMOS testing, just use the appropriate voltage sign for
sourcing the proper voltage polarity.
The tests for the PulseIV-Complete project are shown in the Project View in
initialization test are described below. See
tests.
Initialization Tests
•
AutocalScope – Runs the self calibration and offset measurement routine for the scope
card. This routine should be run before every PulseIV cal and periodically to capture any
drift in the scope card. It requires all connections be removed from the scope card and takes
less than one minute.
12-4
See Pulse IV in Section 4 of the Applications Manual for details on connecting and
running the PIV package tests.
duty cycle is 0.1%.
Return to
"PIV tests" on page 12-8
Section Topics
Model 4200-SCS Reference Manual
Figure
12-4. The
for descriptions of the Pulse IV
4200-901-01 Rev. S / May 2017
3-
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