Keithley 4200-SCS Reference Manual page 1597

Semiconductor characterization system
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Model 4200-SCS Reference Manual
Figure K-29
Open a wafer map file window
Step 4. Load, align, and contact the wafer
NOTE:
1.
Figure K-30
Nucleus toolbar
4200-901-01 Rev. S / May 2017
The following procedure is accomplished using Nucleus UI on the probe station
PC.
From the Nucleus toolbar
Control window will open
Return to
(Figure
K-30), select Window
(Figure
K-31).
Section Topics
Appendix K: Cascade Summit-12000 Prober
Motion Control. The Motion
K-17

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