Keithley 4200-SCS Reference Manual page 1594

Semiconductor characterization system
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Appendix K: Cascade Summit-12000 Prober
NOTE:
Figure K-23
Step 5: Wafer Map Wizard
NOTE:
18.
Click Next.
19.
Specify the test sequence
Figure K-24
Step 6: Wafer Map Wizard
20.
Click Finish.
K-14
Click and drag to select multiple sites.
Refer to the probesites and probesubsites KITE project examples for specifics on
selecting sites to probe.
Return to
(Figure
K-24).
Section Topics
Model 4200-SCS Reference Manual
4200-901-01 Rev. S / May 2017

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