Keithley 4200-SCS Reference Manual page 1536

Semiconductor characterization system
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Appendix H: Suss MicroTec PA-200 Prober
5.
Select Die Map from the View pull-down
Figure H-42
View pull-down
• Select Table editor from the View pull-down in order to display the spreadsheet portion
• From the options pull-down, select units (Microns or Mils).
• Edit the table with the coordinates of the desired subsites.
• Ensure that you save changes using Save or Save As from the Table menu.
Figure H-43
DieMap dialog
NOTE:
H-28
of the Die Map
(Figure
H-43).
An x in the On column defines the subsites that will be probed when using subsite
probing project (in other words, when using PrSSMovNxt) even though other subsites
may be defined in the list.
Return to
(Figure
H-42). Set up the die map:
Section Topics
Model 4200-SCS Reference Manual
4200-901-01 Rev. S / May 2017

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