Keithley 4200-SCS Reference Manual page 1712

Semiconductor characterization system
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Model 4200-SCS Reference Manual
Real time plotting for UTMs
Rear panel
............................................................1-7
Recommended matrix cards
Recommended switching mainframes
Reference Manual synopsis
Relationships between a project, a UTM, a user
module, and user libraries
Relationships between KULT and KITE and between
user libraries, user modules, and UTMs
Relocated
4terminal-n-fet-2nd_in _subsite Device Plan
6-81
4terminal-n-fet-2nd_in _subsite Device Plan in
the u_mod Project Plan
move_me UTM in project
move_me UTM in Test Sequence Table
subsite_b plan in Subsite Sequence Table
subsite_b plan in u_mod project plant
Relocating an ITM
Remote sense test system using Model 7174A matrix
cards
............................................................ B-4
Remote sensing
Removing a component from the system configuration
.................................................................... B-16
Renamed "vds-id" graph axes
Renamed KITE-library ITM inserted in the project plan
.....................................................................6-64
Renamed library ITM added to the Test Sequence
Table
..........................................................6-63
Repeating a test
Resized and repositioned graph example
Resized graph example
Result of pressing Copy to add a same-named ITM to
a different subsite plan
Result of pressing Copy to add a same-named ITM to
a given device plan
Result of pressing Copy to add a same-named ITM
within a given subsite plan
Results of decreasing the Data Points value
6-118
Results of increasing the Data Points value beyond
the default of 10
RetryCancelDialog
RETURNED STATUS VALUES
.................................................................. D-10
Row-column connection scheme
RS-232 connector location
RS-232 connector terminals
Run-time lock message
S
Sample 8860 prober configuration file
Sample PA-200 prober configuration file
Sample probe site location
Sample reference site location
Sampling Mode settings
Sampling Mode timing diagram
Save As window
Save KCON system configuration
Save the system configuration
Save, compile, and build library
SaveCableCompCaps590 (default parameters)
SaveCableCompCaps82 user module
Saving the user module
Schematic of pulse channel and connected DUT
Index-14
................................6-16
...............................4-16
................4-15
.................................1-8
........................6-143
.......8-4
..........................6-81
...........................6-83
....6-83
........6-78
..............................................6-66
..................................................5-10
..........................6-214
...............................................6-172
........6-282
....................................6-281
...............................6-65
.....................................6-64
.........................6-65
.. 6-115
,
............................6-115
............................................. A-13
......................... B-8
.................................4-24
...............................4-24
......................................8-57
...................I-4
............. H-4
.................................. G-7
............................ G-6
...................................6-137
........................6-137
...............................................6-284
..................... B-20
............................ O-6
......................... O-19
.............. E-42
......................................8-23
SDM cycle
Second instance of a same-named ITM added to the
Second instance of a same-named ITM added to the
Segment Stress/Measure Mode
Select Default KITE Project window
Selected area of Figure 6-247 after enlargement by
.....
Selected device and destination folder
Selected ITM and destination folder
Selected subsite_b plan to be moved
Selecting a Device Plan for execution
Selecting a location in the device plan for the
Selecting a new user library directory
6-78
Selecting a Subsite Plan for execution
Selecting a Subsite Plan to add a second
Selecting a test for execution
Selecting an ITM
Selecting and renaming a library Device Plan
Selecting locations for the 2nd, 3rd, etc. Device Plans
Selecting the data variables to be displayed
Selecting the device in which to insert a new UTM
Selecting the location for a second "vds-id" ITM for the
Selecting the location for the first library Device Plan
Selecting the location in the device for the first library
Selecting the project node
Selecting where the first Subsite Plan should go
Selection of a personal test library directory in a Kite -
,
Selection of the four "vds-id" IDSAT values
Send device-dependent string
SENSE
6-117
Sensing overview
Sequencing tests on multiple devices
Set chuck heights
Set Component Mode
Set Reference dialog box
Set Reference Die button
Set X, Y die size button
Set X, Y die size dialog box
SetChuck Temp user module
Setting up calculations in a Calc worksheet
Settings worksheet
Setup Options window
Shared characteristics and unique characteristics for
Shared characteristics and unique characteristics for
Sheet tab Data worksheet
C-32
Sheet-tab Data worksheet and Graph tab
ShortCal4294 user module
Signal paths for "2-wireresistor" tests
......
11-15
.......................................................... 5-15
Project Plan
................................................ 6-67
Test Sequence Table
................................. 6-66
....................... 6-321
Zoom In
.................................................... 6-279
completely new ITM
................................... 6-67
same-named Device Plan to u_build project
6-57
........................... 6-167
................................................ 6-61
in a Subsite Plan
........................................ 6-55
name
.......................................................... 6-70
u_build project
............................................ 6-62
in a Subsite Plan
........................................ 6-54
ITM
............................................................. 6-59
................... 6-160
Select Directory window
........................... 6-343
......................... 8-131
............................................................... 2-10
................................................. 5-8
Execute the test sequence (Subsite Plan)
Open "ivswitch" project
............................. O-10
Modify test sequence
........................ O-11
...............................................H-20
...................................... 8-145
........................... I-18
........................... I-17
....................................... I-16
................................ I-17
.............................N-12
........................................... 6-203
........................................ I-20
same-named project ITMs
............... 6-58
same-named project UTMs
............ 6-69
.................................. 6-22
................................N-10
4200-901-01 Rev. S / May 2017
Index
................. 6-337
............ 6-150
................. 6-153
................ 6-78
.............. 6-165
................ 8-45
............. 6-163
....
... 6-56
.... 6-257
,
6-161
6-51
..... 6-259
............... O-10
O-12
,
I-21
,
I-20
..... 6-188
,
6-86
,
6-143
.......... 6-31
.................. O-8

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