Keithley 4200-SCS Reference Manual page 1689

Semiconductor characterization system
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Model 4200-SCS Reference Manual
The rdson test has a potential shortcoming. If the drain current is noisy, the two current
measurements may not be representative of the actual drain current. Therefore, the calculated
resistance may be incorrect.
In this example, the user module will be modified in KULT such that 10 current measurements will
be performed at Vd1 and 10 more at Vd2. The current readings at Vd1 will be averaged to yield
Id1, and the current readings at Vd2 will be averaged to yield Id2. Using averaged current readings
smooths out the noise. For details on using KULT, refer to the
Section
Open KULT
From the desktop, open the KULT tool by double-clicking the KULT icon. The KULT main window
is shown in
Figure O-20
KULT main window
4200-901-01 Rev. S / May 2017
8.
Figure
O-20.
Return to
Section Topics
Appendix O: Advanced Applications
Keithley User Library Tool (KULT),
O-13

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