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Table 1.3.1 Description of Pin Functions (4/5)
Type
Pin Name
Serial I/O
TXD0
RXD0
TXD1
RXD1
TXD2
RXD2
TXD3
RXD3
TXD4
RXD4
TXD5
RXD5
Real-time
RTDTXD
debugger
RTDRXD
(RTD)
RTDCLK
RTDACK
CAN
CTX0, CTX1 Transmit data
CRX0, CRX1 Received data
JTAG
JTMS
JTCK
JTRST
JTDI
JTDO
Signal Name
Input/Output Description
Transmit data
Output
Received data
Input
Transmit data
Output
Received data
Input
Transmit data
Output
Received data
Input
Transmit data
Output
Received data
Input
Transmit data
Output
Received data
Input
Transmit data
Output
Received data
Input
RTD transmit data
Output
RTD received data
Input
RTD clock input
Input
RTD acknowledge
Output
Output
Input
Test mode select
Input
Test clock
Input
Test reset
Input
Test data input
Input
Test data output
Output
Transmit data output pin for serial I/O channel 0.
Received data input pin for serial I/O channel 0.
Transmit data output pin for serial I/O channel 1.
Received data input pin for serial I/O channel 1.
Transmit data output pin for serial I/O channel 2.
Received data input pin for serial I/O channel 2.
Transmit data output pin for serial I/O channel 3.
Received data input pin for serial I/O channel 3.
Transmit data output pin for serial I/O channel 4.
Received data input pin for serial I/O channel 4.
Transmit data output pin for serial I/O channel 5.
Received data input pin for serial I/O channel 5.
Serial data output pin for the real-time debugger.
Serial data input pin for the real-time debugger.
Serial data transmit/receive clock input pin for the real-time
debugger.
A low-level pulse is output from this pin synchronously with
the start clock for the real-time debugger's serial data output
word. The low-level pulse width indicates the type of command/
data received by the real-time debugger.
This pin outputs data from the CAN module.
This pin accepts as input the data for the CAN module.
Test mode select input to control the state transition of the
test circuit.
Clock input for the debug module and test circuit.
Test reset input to initialize the test circuit asynchronously
with device operation.
This pin accepts as input the test instruction code or test data
that is serially received.
This pin outputs the test instruction code or test data serially.
1-12
OVERVIEW
1.3 Pin Functions
32180 Group User's Manual (Rev.1.0)
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