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successive approximation
temperature coefficient
temperature drift
terminal-based characteristic
transfer function
transfer function errors
UART
V
rejection
CC
watchdog timer
WDT
word
WORD
An A/D conversion method that uses a binary search
to arrive at the best digital representation of an analog
input.
Change in the stated variable for each degree
Centigrade of temperature change.
The change in a specification due to a change in
temperature. Temperature drift can be calculated by
using the temperature coefficient for the specification.
An actual characteristic that has been translated and
scaled to remove zero-offset error and full-scale error.
A terminal-based characteristic resembles an actual
characteristic with zero-offset error and full-scale
error removed.
A graph of output code versus input voltage; the
characteristic of the A/D converter.
Errors inherent in an analog-to-digital conversion
process: quantizing error, zero-offset error, full-scale
error, differential nonlinearity, and nonlinearity.
Errors that are hardware-dependent, rather than being
inherent in the process itself, include feedthrough,
repeatability,
channel-to-channel
isolation, and V
rejection errors.
CC
Universal asynchronous receiver and transmitter. A
part of the serial I/O port.
The property of an A/D converter that causes it to
ignore (reject) changes in V
characteristic is unaffected by those changes. The
effectiveness of V
rejection is measured by the ratio
CC
of the change in V
CC
characteristic.
An internal timer that resets the device if software
fails to respond before the timer overflows.
See watchdog timer.
Any 16-bit unit of data.
An unsigned, 16-bit variable with values from 0
16
through 2
–1.
GLOSSARY
matching,
so that the actual
CC
to the change in the actual
Glossary-11
off-
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