Intel 8XC196NT User Manual page 503

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8XC196NT USER'S MANUAL
AD_TEST
AD_TEST
The A/D test (AD_TEST) register enables conversions on ANGND and V
adjustments for DC offset errors. Its functions allow you to perform two conversions, one on ANGND
and one on V
. With these results, a software routine can calculate the offset and gain errors.
REF
7
Bit
Bit
Number
Mnemonic
7:4
3:2
OFF1:0
1
TV
0
TE
C-8
Reserved; for compatibility with future devices, write zeros to these bits.
Offset
These bits allows you to set the zero offset point.
OFF1 OFF0
0
0
no adjustment
0
1
add 2.5 mV
1
0
subtract 2.5 mV
1
1
subtract 5.0 mV
Test Voltage
This bit selects the test voltage for a test mode conversion.(The TE bit
must be set to enable test mode.)
1 = V
REF
0 = ANGND
Test Enable
This bit determines whether normal or test mode conversions will be
performed. A normal conversion converts the analog signal input on one
of the analog input channels. A test conversion allows you to perform a
conversion on ANGND or V
1 = test
0 = normal
Address:
Reset State:
and specifies
REF
OFF1
OFF0
Function
, selected by the TV bit.
REF
1FAEH
C0H
0
TV
TE

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