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DC input leakage
deassert
differential nonlinearity
doping
double-word
DOUBLE-WORD
DPRAM
EDAR
EPA
EPC
EPORT
EPROM
ESD
Leakage current from an analog input pin to ground.
The act of making a signal inactive (disabled). The
polarity (high or low) is defined by the signal name.
Active-low signals are designated by a pound symbol
(#) suffix; active-high signals have no suffix. To
deassert RD# is to drive it high; to deassert ALE is to
drive it low.
The difference between the actual code width and the
ideal one-LSB code width of the terminal-based
characteristic of an A/D converter. It provides a
measure of how much the input voltage may have
changed in order to produce a one-count change in the
conversion result. Differential nonlinearity is a
measure of local code-width error; nonlinearity is a
measure of overall code-transition error.
The process of introducing a periodic table Group III
or Group V element into a Group IV element (e.g.,
silicon). A Group III impurity (e.g., indium or
gallium) results in a p-type material. A Group V
impurity (e.g., arsenic or antimony) results in an n-
type material.
Any 32-bit unit of data.
An unsigned, 32-bit variable with values from 0
32
through 2
–1.
Dual-port RAM. A type of random-access memory
commonly used to hold shared data when using a
parallel bus for communication between two CPUs.
Extended data address register used by the EPORT.
Event processor array. An integrated peripheral that
provides high-speed input/output capability.
Extended program counter used by the EPORT.
Extended addressing port. The port that provides the
additional
address
addressing.
Erasable, programmable read-only-memory.
Electrostatic discharge.
GLOSSARY
lines
to
support
Glossary-3
extended
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