Fetch? Subsystem; Description; Syntax Diagrams And Command Descriptions - Agilent Technologies 8960 Series Reference Manual

FETCh? Subsystem

Description

The FETCh? query is a function that allows users to query results from a measurement that was previously
INITiated or READ. It does NOT begin a measurement. If no measurement is in progress it will return the
integrity and measurement values from the last measurement made, or return an integrity of No Result
Available and results of NAN. If a measurement is in process, the query will hang until the results are
available, or the measurement fails or times out. The exact results returned with a FETCh? will depend on the
specific measurement. A measurement may have a number of different results or combination of results for a
FETCh?. The FETCh? queries are intended to be used to provide overlapped operation access to measurement
results from the test set. When used along with SETup and INITiate commands , FETCh? is the primary way
for the user to retrieve measurement results. In order to use the test set's concurrent test capabilities the
overlapped commands of INITiate and FETCh? must be used. Overlapped commands allow the user to send
commands and not wait for completion.

Syntax Diagrams and Command Descriptions

"FETCh:AFANalyzer" on page 315
"FETCh:WACLeakage" on page 325
"FETCh:WBERror" on page 328
"FETCh:WCDomain" on page 331
"FETCh:WCPower" on page 337
"FETCh:WOBWidth" on page 341
"FETCh:WSEMask" on page 345
"FETCh:WTPower" on page 351
"FETCh:WWQuality" on page 355
(AF Analyzer measurements)
(Adjacent Channel Leakage measurements)
(Loopback Bit Error Ratio measurements)
(Code Domain measurements)
(Channel Power measurements)
(Occupied Bandwidth measurements)
(Spectrum Emission Mask measurements)
(Thermal Power measurements)
(Waveform Quality measurements)
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FETCh? Subsystem
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