A1.5 Test Features - ARM Cortex-A76 Core Technical Reference Manual

A1.5 Test features
The Cortex-A76 core provides test signals that enable the use of both Automatic Test Pattern Generation
(ATPG) and Memory Built-In Self Test (MBIST) to test the core logic and memory arrays.
100798_0300_00_en Copyright © 2016–2018 Arm Limited or its affiliates. All rights
reserved.
Non-Confidential
A1 Introduction

A1.5 Test features

A1-30