Fixture Compensation; Fixture Compensation Procedure - Agilent Technologies 4294A Operating Manual

Fixture Compensation

Fixture compensation procedure

Perform the fixture compensation as follows:
NOTE If the oscillator level is greater than 500 mV, an error, "REDUCE OSC LEVEL" or
"BRIDGE UNBALANCED," may occur during the Short correction and measurement
may not be correct. When you set the oscillator level for measurement to 500 mV or even
greater, set it to 500 mV for the Fixture correction.
NOTE Fixture compensation consists of three compensation data acquisition processes: OPEN,
SHORT, and LOAD, but you do not need to obtain all three types of compensation data
when you perform fixture compensation. Each type of compensation data can be turned on
or off independently for measurement. For normal measurement, it is recommended that
you perform fixture OPEN compensation and fixture SHORT compensation.
NOTE For the 4294A, because the sending and receiving ends of a measurement path are
terminated with the characteristic impedance of 50 W at a measurement frequency of 15
MHz for no cable extension (direct connection type test fixture) or a measurement
frequency of 5 MHz or higher for 1 m/2 m cable extension, the trace may contain a gap at
15 MHz (or 5 MHz). You can remove this gap by executing the Load correction.
Step 1. Press the
Step 2. Select the calibration (compensation) data acquisition points in accordance with "Selecting
Calibration/Compensation Data Points" on page 155.
Step 3. Press the
Step 4. If required, set user-defined standard values in accordance with "Defining the standard
values for fixture compensation" on page 153.
NOTE
When you perform fixture LOAD compensation for the 16451B Dielectric Test Fixture,
you need special setups and procedures for standard definition and other processes. See
"Fixture Compensation When the 16451B is Used" on page 136 for details.
When you complete the changes, press the
Compensation Menu.
Step 5. Put the test fixture's device contacts in the OPEN state.
NOTE Refer to the operation manual furnished with each test fixture for more information on the
OPEN state of the test fixture. Generally, the OPEN state can be made by connecting no
device to the device contacts. If the distance between the HIGH electrode and the LOW
electrode can be adjusted for a test fixture, keep the same distance as when the test device
is inserted between the electrodes.
Chapter 6
key to display the Calibration Menu.
[Cal]
key to display the Fixture Compensation Menu.
FIXTURE COMPEN
Fixture Compensation
key to return to the Fixture
return
Calibration
151