Canon CLC 1120 Service Manual page 726

DENS
COPYRIGHT © 1999 CANON INC.
DVFF-700
PFF-Y
PFF-M
PFF-C
PFF-K
DENS-Y
DENS-M
DENS-C
DENS-K
WINDOW-Y
WINDOW-M
WINDOW-C
WINDOW-K
DMAX-Y
DMAX-M
DMAX-C
DMAX-K
VRATE-Y
VRATE-M
VRATE-C
VRATE-K
PTOFST-Y
PTOFST-M
PTOFST-C
PTOFST-K
D-Y-TRGT
D-M-TRGT
D-C-TRGT
REF-Y
REF-M
REF-C
SGNL-Y
CANON CLC1120/1130/1150 REV.0 MAR. 1999 PRINTED IN JAPAN (IMPRIME AU JAPON)
CHAPTER 13 TROUBLESHOOTING
dark area potential attenuation ( V) at laser VFF
while the drum surface potential is at 700 V
setting of laser pulse width for Y
setting of laser pulse width for M
setting of laser pulse width for C
setting of laser pulse width for Bk
result of computation of the developer concentration
inside the Y developing assembly
result of computation of the developer concentration
inside the M developing assembly
result of computation of the developer concentration
inside the C developing assembly
result of computation of the developer concentration
inside the Bk developing assembly
window soiling coefficient of Y
window soiling coefficient of M
window soiling coefficient of C
window soiling coefficient of Bk
solid density of Y at time of auto gradation
correction
solid density of M at time of auto gradation
correction
solid density of C at time of auto gradation
correction
solid density of Bk at time of auto gradation
correction
control value for Y used to determine contrast
potential
control value for M used to determine contrast
potential
control value for C used to determine contrast
potential
control value for Bk used to determine contrast
potential
offset value of laser strength for Y patch image
density correction
offset value of laser strength for M patch image
density correction
offset value of laser strength for C patch image
density correction
offset value of laser strength for Bk patch image
density correction
target value for Y developer concentration
target value for M developer concentration
target value for C developer concentration
measurement of the concentration reference signal
inside the Y developing assembly (present value;
direct light from LED)
measurement of the concentration reference signal
inside the M developing assembly (present value;
direct light from LED)
measurement of the concentration reference signal
inside the C developing assembly (present value;
direct light from LED)
measurement of the present Y developer
concentration (present value)
13-199