R&S AFQ100A Operating Manual page 269

R&S AFQ100A
[SOURce:]TSIGnal:CLOCk 1 kHz... 300 MHz
The command enters the sample clock frequency for generating either a sine, rectangular or a
table sine test signal.
1 kHz ... 300 MHz
The sample clock rate must not exceed the maximum ARB clock rate of 300 MHz. Sample clock
rates between 300 MHz and 600 MHz are not available and set to maximum ARB clock rate of
300 MHz.
Example: SOUR:TSIG:CLOC 300e6
*RST value
1 MHz
[SOURce:]TSIGnal:PATTern:CREate
The command generates a waveform which is output directly.
This command triggers an event and therefore has no *RST value and no query form.
Example: PATT:TSIN:CRE
*RST value
-
[SOURce:]TSIGnal:PATTern:CREate:NAMed <waveform filename>
The command generates a sine test signal and stores the file on the local hard disk (HD).
The Create Test Signal window opens automatically and the signal can be stored as a waveform
file.
This command triggers an event and therefore has no *RST value and no query form.
Example: TSIG:PATT:CRE:NAM "D:\temp\test.wv"
*RST value
-
[SOURce:]TSIGnal:PATTern:I 0 ... 65535
Enters the pattern number of the I component.
Example: TSIG:TSIN:PATT:I 5
*RST value
0
1401.3084.32
'sets sample clock frequency to 300 MHz.
Resolution Options
'a signal is generated and output directly.
Resolution Options
'writes the generated waveform file to 'test.wv' on the HD.
Resolution Options
'sets the test pattern for the I component to 5.
Resolution Options
AFQ Commands - Signal Generation
6.8
SCPI
Device-specific
SCPI
Device-specific
SCPI
Device-specific
SCPI
Device-specific
E-3