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2.0 RAP TEST FLOW
Pull 500* piece sample from lot following Group A
acceptance.
45*
PTHB
48 HRS
FINAL
ELECTRICAL
(48 HRS)
SCRAP
#One sample per month for FAST, LS, 10H, 10K, MG CMOS, and HSL CMOS.
* PTHB or PTH not required for hermetic products: reduce total sample size to 450 pcs.
** Seal (Fine & Gross Leak) required only for hermetic products.
*** PTH to be used when sockets for PTHB are not available.
3.0 TEST CONDITIONS AND COMMENTS
PTHB — 15 psig/121 C/100% RH at rated V CC or V EE — to
be performed on plastic encapsulated devices
only.
TEMP CYCLING — MIL–STD–883, Method 1010, Condi-
tion C, – 65 C/+ 150 C.
OP LIFE — MIL–STD–883, Method 1005, Condition C
(Power plus Reverse Bias), T A = 145 C.
NOTES:
1. All standard 25 C dc and functional parameters will be
measured Go/No/Go at each readout.
MOTOROLA CMOS LOGIC DATA
PTH***
48 HRS
INTERIM
ELECTRICAL
PTH
48 HRS
(ADDITIONAL)
FINAL
ELECTRICAL
(96 HRS)
2. Any indicated failure is first verified and then submitted to
3. Sampling to include all package types routinely.
4. Device types sampled will be by generic type within each
5. 16 hrs. PTHB is equivalent to approximately 800 hours of
6. Only moisture related failures (like corrosion) are criteria
7. Special device specifications (48A's) for logic products will
340
INITIAL
SEAL**
TEMP CYCLES
40 CYCLES
INTERIM
TEST
ADD 460 CYCLES
INTERIM
TEST
ADD 500 CYCLES
FINAL
INTERIM*
TEST
TEMP CYCLES #
1000 CYCLES
(ADDITIONAL)
FINAL
ELECTRICAL
& SEAL**
(2000 CYCLES)
SCRAP
the Product Analysis Lab for detailed analysis.
logic I/C product family (CMOS, TTL, etc.) and will include
all assembly locations (Korea, Philippines, Malaysia, etc.).
v
85 C/85% RH THB for V CC
for failure on PTHB test.
reference 12MRM15301A as source of generic data for
any customer required monthly audit reports.
100
OP LIFE
40 HOURS
INTERIM
ELECTRICAL
OP LIFE
210 HRS (ADDITIONAL)
FINAL
INTERIM #
ELECTRICAL
OP LIFE #
750 HRS
(ADDITIONAL)
FINAL #
ELECTRICAL
(1000 HRS)
SCRAP
15 V.
CHAPTER 3
3–3
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