Overview Of Functions For Statistical Analysis - Agilent Technologies Twelfth 4287A RF LCR Operation Manual

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Obtaining Statistical Data on Measurement Results

Overview of Functions for Statistical Analysis

Overview of Functions for Statistical Analysis
Agilent 4287A's functions for statistical analysis allow you to store the required values of
measurement results (four measurement parameters, test signal voltage level monitor
value, test signal current level monitor value, DC resistance measurement value) in the
order of measurement internally in the unit. These functions also allow you to calculate and
display statistical data based on the stored data.
The parameter names and definitions of the statistical data that can be calculated and
displayed are shown in Table 9-1.
Table 9-1
Statistical analysis parameters of 4287A
Parameter name
Mean value (Mean)
Standard Deviation (SD)
3*SD/Mean
Minimum value (Min)
Maximum value (Max)
Number of normal measurements
(Total = n)
Number of Rdc limit deviations
(Rdc Fail)
Number of overloads (Ovld)
Number of abnormal measurements
(Abnorm.)
Total number of measurements (All)
*1. Measurements where neither Rdc limit deviation nor overload occur.
206
n
x
i
i
=
1
------------- -
(n = number of normal measurements, x
n
measurement number i)
n
2
(
)
x
Mean
i
i
=
1
(n = number of normal measurements, x
----------------------------------------- -
n 1
measurement number i)
×
3 SD
----------------
Mean
Smallest measured value among normal measurements
Largest measured value among normal measurements
Number of measurements performed normally
Number of measurements where Rcd measurement value deviated from
the limit value
Number of measurements where overloaded occurred
Number of measurements where either Rdc limit deviation or overload
occurred
The total number of measurements (including abnormal measurements)
Definition
= normal
i
*1
= normal
i
Chapter 9

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