Agilent Technologies Twelfth 4287A RF LCR Operation Manual page 343

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Names and Functions of Display Areas, 84
SMA(f)-SMA(f) Adapter
contents, 19, 280
Softkey menu name
Names and Functions of Display Areas, 86
Softkeys
Names and Functions of Display Areas, 87
Sorting condition, 177
Names and Functions of Display Areas, 98
Source characteristics
Basic Measurement Characteristics, 253
Speaker
Setting, 233
Specifications, 251
spurious characteristics, 258
sta, 214
Standard Deviation (SD)
statistical analysis parameter, 206
Stand-by switch, 74
Statistical Analysis, 206
Data Logging, 207
Executing and Displaying Results, 209
parameters, 206
Saving the Results, 210
[Stml Select] key
function, 75
Sub Net Mask
checking and editing, 287
Supplemental Performance Characteristics, 251
Svc
equipment status display, 87
Switching time of setup, 262
[System] key
function, 76
System Recovery
How to Execute, 240
System recovery, 285
T
Table
Setup display menu, 91
Table number
How to specify, 104
Names and Functions of Display Areas, 85, 97
Temperature
General Characteristics, 275
Operation environment, 20
Test Fixture
about connection, 46
connection to the Test Fixture Stand, 66
selection guideline, 45
Test Fixture Connection
Basic Operations, 65
Test Fixture Stand
connection to the 4287A, 32
contents, 18, 280
Test Head, 77
Index
contents, 18, 280
Dimensions, 279
How to connect, 31
Test Head Extension Cable
contents, 19, 280
TEST HEAD INTERFACE, 77
Test Head Interface, 77
Test Ports
Maintenance, 330
Test signal current level monitor value
Names and Functions of Display Areas, 86
Selection of Display Parameters, 162
Test signal level
DC resistance (Rdc) measurement, 270
Names and Functions of Display Areas, 92
Uncertainty of monitor value, 271
Test signal level (power)
Selection of Display Parameters, 162
Test signal voltage level monitor value
Names and Functions of Display Areas, 86
Selection of Display Parameters, 162
The, 116
qy (deg)
BIN sort measurement parameter, 179
qy (rad)
BIN sort measurement parameter, 179
qz (deg)
BIN sort measurement parameter, 179
qz (rad)
BIN sort measurement parameter, 179
theta z (deg)
Selection of Measurement Parameters, 160
theta z (rad)
Selection of Measurement Parameters, 160
theta z(rad)
Selection of Measurement Parameters, 160
Throughput
Improvement of Measurement Throughput by Screen
Display Settings, 309
time
setting the date/time, 43
setting the internal clock, 290
time zone
setting, 289
Timing Chart
Handler Interface, 261
Title
Names and Functions of Display Areas, 84
Total number of measurements (All)
statistical analysis parameter, 206
Trigger delay time, 266
Trigger function
Measurement Support Functions, 271
[Trigger] key
function, 76
[Trigger Mode] key
function, 76
Index
343

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