Configuring Smu Forcing Functions/Measure Options Window; Opening A Forcing Functions/Measure Options Window - Keithley 4200-SCS Reference Manual

Semiconductor characterization system
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Section 6: Keithley Interactive Test Environment (KITE)

Configuring SMU Forcing Functions/Measure Options window

A Forcing Functions/Measure Options window is associated with an instrument object that is
assigned to a device terminal. The Forcing Functions/Measure Options window is used to
configure the selected forcing function and measurements implemented by the instrument. This
subsection helps you to do the following:
Open a Forcing Functions/Measure Options window.
Understand and configure each of the ten available forcing functions.
Understand and configure the measurement options that are associated with a forcing
function (Discussed generically, for all forcing functions, at the end of this subsection. Refer
to
Understand and configure the other controls on the Forcing Functions/Measure Options
window.

Opening a Forcing Functions/Measure Options window

To open a Forcing Function/Measure Options window for a terminal, first open the Definition tab
for the ITM (refer to
terminal, click the FORCE MEASURE button of the associated instrument object. The Forcing
Function/Measure Options window for that instrument object appears.
Figure 6-122
window features.
Figure 6-122
Forcing Functions/Measure Options window for an existing library ITM
6-98
Understanding and configuring the Measuring Options area later in this
Opening an ITM window earlier in this
shows an existing Forcing Functions/Measure Options window that illustrates typical
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4200-901-01 Rev. S / May 2017

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