Keithley 4200-SCS Reference Manual page 134

Section 6: Keithley Interactive Test Environment (KITE)
Table 6-1 (continued)
KITE projects
Project Folder
_Memory
(continued)
_Miscellaneous
_Nanotech
_Pulse
6-8
Project
Flash-NOR
Flash-Switch
PMU-Flash-NAND
NVM_Examples
ivswitch
LowCurrent
probesites
probesubsites
NanoDevices
CNTFET
chargepumping
chargetrapping
ivpgswitch
ivpgswitch_340x
PMU-DUT-Examples
PMU-MOSFET
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Description
Uses four pulse generators and two 4200-SMUs to perform
program/erase cycles and then measure Vt. See
perform a flash memory test on my device"
User Manual.
Uses four pulse generators, two 4200-SMUs, and a
Model 707A (for switching) to perform program/erase cycles
and then measure Vt. See
test on my device" in Section 3 of the User Manual.
This project demonstrates the capabilities of the 4225-PMU for
FLASH memory testing (see
Uses 4225-PMU, 4225-RPM and SMUs to characterize NAND
flash, phase change memory, ferroelectric memory, and
resistive memory. See the NVM Application Note link on the
Applications page of the 4200 Complete Reference.
Same as default project but uses Model 708 switching. See
Appendix B.
Uses Model 4200-SMU to measure offset current and then
graphs offset current vs. time. See Application Note 2959.
Uses a switch matrix, prober control, and 4200-SMUs to
generate a family of curves (drain current versus drain voltage)
on wafer sites. See Appendix
Uses a switch matrix, prober control, and Model 4200-SMUs
to generate a family of curves (drain current versus drain
voltage) on wafer subsites. See
Multiple DC I-V measurements on a wide variety of
nanodevices.
Performs optimal DC I-V, pulsed I-V, and C-V measurements
on carbon nanotube (CNT) FETs. See CNT FET Application
Note link on the Applications page of the 4200 Complete
Reference.
Uses a pulse generator and two 4200-SMUs to make
chargepumping measurements using several methods. See
"How to perform Charge Pumping"
Uses a pulse generator to perform a charge trapping test. See
"How to perform a Charge Trapping test"
and Application Note 2518.
Performs automated measurements on a MOSFET using the
Model 708 switch matrix, HP8110 pulse generator, and
4200-SMUs. See Appendix
Same as the ivpgswitch project but uses a Model 340x pulse
generator instead of the HP8110 pulse generator.
This project contains example test modules to test a MOSFET
using the 4225-PMU (see
Uses the 4225-PMU to perform 3-terminal ultra fast I-V and
DC tests on a MOSFET (see
Model 4200-SCS Reference Manual
"How to
in Section 3 of the
"How to perform a flash memory
PMU-Flash-NAND project).
G.
Appendix G.
in the User Manual.
in the User Manual
F.
PMU-DUT-Examples project).
PMU-MOSFET project).
4200-901-01 Rev. S / May 2017