Keithley 4200-SCS Reference Manual page 664

Semiconductor characterization system

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Section 8: Keithley User Library Tool (KULT)

Sweep Integrate

Figure 8-105

sintgX performs an integrated measurement for every point in a sweep.

int sintgi(int instr_id, double *results);

int sintgv(int instr_id, double *results);

The measuring instrument's identification code.

The floating point array where the results are stored.

This function is used to create an entry in the measurement scan table. During any of

the sweeping functions, a measurement scan is performed for every force point in the

sweep. During each scan, a measurement will be made for every entry in the scan

table. The measurements are made in the same order which the entries were made in

the scan table.

sintgX sets up the new scan table entry to perform an integrated measurement. The

measurement results will be stored in the array specified by results. Each time a

measurement scan is made, a new measurement result will be stored at the next

location in the results array. If the scan table is not cleared, performing multiple sweeps

will simply keep adding new measurement results to the end of the array. Care must be

taken to be sure the results array is large enough to hold all measurements which will

be taken before the scan table is cleared. The scan table is cleared by an explicit call to

clrscn, or implicitly when devint or execut is called.

The following example collects information on the low-level gate leakage current of a

MOSFET. Sixteen integrated measurements are made as the voltage is increased from 0

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Model 4200-SCS Reference Manual

4200-901-01 Rev. S / May 2017

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