Keithley 4200-SCS Reference Manual page 656

Semiconductor characterization system
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Section 8: Keithley User Library Tool (KULT)
Example
savgX
Sweep average
Purpose
Format
Remarks
Example
8-140
When the test sequence is executed, the sweep function initiates the first step of the
voltage or current sweep. The sweep then logs the force point that the buffer specified
by rtfary.
Locate rtfary before the sweep. The number of data points returned by rtfary is
determined by the number of force points generated by the sweep.
Refer to the examples for the smeasx and sweepx functions.
Performs an averaging measurement for every point in a sweep.
int savgi(int instr_id, double *results, long count, double
delay);
int savgv(int instr_id, double *results, long count, double
delay);
The measuring instrument's identification code.
instr_id
The floating point array where the results are stored.
results
The number of measurements made at each point before the
count
average is computed.
The time delay in seconds between each measurement within a
delay
given ramp step.
This function is used to create an entry in the measurement scan table. During any of
the sweeping functions, a measurement scan is performed for every force point in the
sweep. During each scan, a measurement will be made for every entry in the scan
table. The measurements are made in the same order in which the entries were made
in the scan table.
savgX sets up the new scan table entry to perform an averaging measurement. The
measurement results will be stored in the array specified by results. Each time a
measurement scan is made, a new measurement result will be stored at the next
location in the results array. If the scan table is not cleared, performing multiple sweeps
will simply keep adding new measurement results to the end of the array. Care must be
taken to be sure the results array is large enough to hold all measurements which will
be taken before the scan table is cleared. The scan table is cleared by an explicit call to
clrscn, or implicitly when devint or execut is called.
When making each averaged measurement, count actual measurements will be made
on the instrument delay seconds apart and the average calculated. This average is
the value that will be stored in the results array.
This example obtains the measurement data needed to construct a graph showing the
capacitance-versus-voltage characteristics of a variable capacitance diode. This diode is
operated in reverse biased mode. SMU1 outputs a voltage that sweeps from 0
through -50 V. Capacitance is measured 26 times during the sweep. The results are stored
in an array called res1.
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Model 4200-SCS Reference Manual
4200-901-01 Rev. S / May 2017

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